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1. B. Rieger, L.J. van Vliet, Curvature of n-dimensional space curves in grey-value images, IEEE Transactions on Image Processing, Vol. 11, No. 7, 738-745, 2002.

2. I.T. Young, L.J. van Vliet, M. van Ginkel, Recursive Gabor filtering, IEEE Transactions on Signal Processing, Vol. 50, No. 11, 2798-2805, 2002.

3. L.R. van den Doel, R. Moerman, G.K. van Dedem, I.T. Young, and L.J. van Vliet, Monitoring enzyme-catalyzed reactions in micromachined nanoliter wells using a conventional microscope based micoarray reader, in: Darryl J. Bornhop, David A. Dunn, Raymond P. Mariella, Catherine J. Murphy, Dan V. Nicolau, Shuming Nie, Michelle Palmer, Ramesh Raghavachari (eds.), Biomedical Nanotechnology Architectures and Applications (San Jose, CA, USA, Jan.20-21), Proc. SPIE, vol. 4626, 2002, 366-377.

4. B. Rieger, F.J. Timmermans, L.J. van Vliet, P.W. Verbeek, Curvature estimation of surfaces in 3-D grey-value images, in: R. Kasturi, D. Laurendeau, C. Suen (eds.), ICPR16, Proceedings 16th International Conference on Pattern Recognition (August 11-15, 2002, Quebec City, Canada), Vol.1, IEEE Computer Society Press, Los Alamitos, 2002, 684-687.

5. B. Rieger, F.J. Timmermans, L.J. van Vliet, Estimation of curvature on surfaces in 3D grey-value images, in: E.F. Deprettere, A. Belloum, J.W.J. Heijnsdijk, F. van der Stappen (eds.), Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging (Lochem, NL, June 19-21, 2002), ASCI, Delft, 2002, 170-177.

6. J. Dijk, M. van Ginkel, R.J. van Asselt, L.J. van Vliet, P.W. Verbeek, A new sharpness measure based on Gaussian lines and edges, in: E.F. Deprettere, A. Belloum, J.W.J. Heijnsdijk, F. van der Stappen (eds.), Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging (Lochem, NL, June 19-21, 2002), ASCI, Delft, 2002, 39-43.