2000

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  1. G.M.P. van Kempen, L.J. van Vliet, Background estimation in non-linear image restoration, Journal of the Optical Society of America A  - Optics and Image Science, vol. 17, no. 3, 2000, 425-433.

  2. G.M.P. van Kempen, L.J. van Vliet, The influence of the regularisation parameter and the first estimate on the performance of Tikhonov regularised non-linear image restoration algorithms, Journal of Microscopy, vol. 198, no. 1, 2000, 63-76.

  3. G.M.P. van Kempen, and L.J. van Vliet, Mean and variance of ratio estimators used in fluorescence ratio imaging , Cytometry, vol. 39, no. 4, 2000, 300-305.

  4. C.L. Luengo Hendriks, L.J. van Vliet, Improving resolution to reduce aliasing in an undersampled image sequence, in: M.M. Blouke, G.M. Williams, N. Sampat, T. Yeh (eds.), Sensors, Cameras, and Systems, for Scientific/Industrial Applications II (Proc. Electronic Imaging 2000 Conf. San Jose, CA, Jan.24-25), Proc. SPIE, vol. 3965A-23, 2000, p. S4.

  5. G.J. de Wolff, L.J. van Vliet, Design of a four channel spectral analyzer to resolve linear combinations of two fluorescent spectra, in: G.H. Bearman, D. Cabib, R.M. Levenson (eds.), Spectral Imaging: Instrumentation, Applications, and Analysis (Proc. BIOS 2000 Conf. San Jose, CA, Jan.25), Proc. SPIE, vol. 3920-04, 2000, 21-31.

  6. K.T. Hjelt, G.W. Lubking, M.J.Vellekoop, L.J. van Vliet, L.R. van den Doel, A. Greiner, I.G. Korvink,  Nanoliter droplet behaviour in micromachined wells, in: Sensors Update 8, Baltes, Henry / Göpel, Wolfgang / Hesse, Joachim (eds.), Wiley, 2000, 39-72.

  7. L.R. van den Doel , L.J. van Vliet, K.T. Hjelt, M.J. Vellekoop, F. Gromball, J.G Korvink, I.T. Young, Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, T. Huang, J. Serra (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition  (Barcelona, Spain, Sep.3-7), vol. 3, Image, Speech, and Signal Processing, IEEE Computer Society Press, Los Alamitos, 2000, 57-62.

  8. L.R. van den Doel, M.J. Vellekoop, P.M. Sarro, R. Moerman, J. Frank, G. van Dedem, K.T. Hjelt, L.J. van Vliet, and I.T. Young, Microarrays for biotechnology: The imaging challenge, in: Y.J. Zhang (eds.), Proceedings ICIG'2000, First International Conference on Image and Graphics, Journal of Image and Graphics (JIG), 2000, 36-41.

  9. I.T. Young, L.J. van Vliet, M. van Ginkel, Recursive Gabor filtering, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, T. Huang, J. Serra (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition  (Barcelona, Spain, Sep.3-7), vol. 3, Image, Speech, and Signal Processing, IEEE Computer Society Press, Los Alamitos, 2000, 342-345.

  10. I.T. Young, L.J. van Vliet, M. van Ginkel, Recursive Gabor filtering, in: Y.J. Zhang (eds.), Proceedings ICIG'2000, First International Conference on Image and Graphics, Journal of Image and Graphics (JIG), 2000, 232-236.

  11. I.T. Young and L.J. van Vliet, M. van Ginkel, Recursive Gabor filtering, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 245-249.

  12. C.L. Luengo Hendriks and L.J. van Vliet, Morphological scale-space to differentiate microstructures of food products, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 289-293.

  13. M. van Ginkel, L.J. van Vliet, and P.W. Verbeek, Robust Curvature Estimation by Finding Optimal Circular Segments in Orientation Space, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 53-58.

  14. L.R. van den Doel and L.J. van Vliet, A Temporal Phase Unwrapping Algorithm Applied to Dynamic Interferograms Generated in Evaporating Picoliter Liquid Samples, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 319-326.