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G.M.P. van Kempen, L.J. van Vliet,
Background
estimation in non-linear image restoration, Journal of the Optical
Society of America A - Optics and Image Science, vol. 17, no. 3,
2000, 425-433.
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G.M.P. van Kempen, L.J. van Vliet,
The
influence of the regularisation parameter and the first estimate on the
performance of Tikhonov regularised non-linear image restoration algorithms,
Journal of Microscopy, vol. 198, no. 1, 2000, 63-76.
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G.M.P. van Kempen, and L.J. van Vliet, Mean
and variance of ratio estimators used in fluorescence ratio imaging
, Cytometry, vol. 39, no. 4, 2000, 300-305.
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C.L. Luengo Hendriks, L.J. van Vliet, Improving
resolution to reduce aliasing in an undersampled image sequence,
in: M.M. Blouke, G.M. Williams, N. Sampat, T. Yeh (eds.), Sensors, Cameras,
and Systems, for Scientific/Industrial Applications II (Proc. Electronic
Imaging 2000 Conf. San Jose, CA, Jan.24-25), Proc. SPIE, vol. 3965A-23,
2000, p. S4.
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G.J. de Wolff, L.J. van Vliet, Design
of a four channel spectral analyzer to resolve linear combinations of two
fluorescent spectra, in: G.H. Bearman, D. Cabib, R.M. Levenson
(eds.), Spectral Imaging: Instrumentation, Applications, and Analysis (Proc.
BIOS 2000 Conf. San Jose, CA, Jan.25), Proc. SPIE, vol. 3920-04, 2000, 21-31.
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K.T. Hjelt, G.W. Lubking, M.J.Vellekoop, L.J. van Vliet, L.R. van den Doel,
A. Greiner, I.G. Korvink, Nanoliter
droplet behaviour in micromachined wells, in: Sensors Update 8, Baltes, Henry / Göpel, Wolfgang /
Hesse, Joachim (eds.), Wiley, 2000,
39-72.
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L.R. van den Doel , L.J. van Vliet, K.T. Hjelt, M.J. Vellekoop, F. Gromball,
J.G Korvink, I.T. Young, Nanometer-Scale
Height Measurements in Micromachined Picoliter Vials based on Interference
Fringe Analysis, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell,
R. Alquezar, T. Huang, J. Serra (eds.), ICPR15, Proc. 15th Int. Conference
on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 3, Image,
Speech, and Signal Processing, IEEE Computer Society Press, Los Alamitos,
2000, 57-62.
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L.R. van den Doel, M.J. Vellekoop, P.M. Sarro, R. Moerman, J. Frank, G.
van Dedem, K.T. Hjelt, L.J. van Vliet, and I.T. Young, Microarrays
for biotechnology: The imaging challenge, in: Y.J. Zhang (eds.),
Proceedings ICIG'2000, First International Conference on Image and Graphics,
Journal of Image and Graphics (JIG), 2000, 36-41.
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I.T. Young, L.J. van Vliet, M. van Ginkel, Recursive
Gabor filtering, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell,
R. Alquezar, T. Huang, J. Serra (eds.), ICPR15, Proc. 15th Int. Conference
on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 3, Image,
Speech, and Signal Processing, IEEE Computer Society Press, Los Alamitos,
2000, 342-345.
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I.T. Young, L.J. van Vliet, M. van Ginkel, Recursive
Gabor filtering,
in: Y.J. Zhang (eds.), Proceedings ICIG'2000,
First International Conference on Image and Graphics, Journal of Image
and Graphics (JIG), 2000, 232-236.
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I.T. Young and L.J. van Vliet, M. van Ginkel,
Recursive
Gabor filtering, in: L.J. van Vliet, J.W.J. Heijnsdijk,
T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf.
of the Advanced School for Computing and Imaging (Lommel, Belgium, June
14-16), ASCI, Delft, 2000, 245-249.
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C.L. Luengo Hendriks and L.J. van Vliet, Morphological
scale-space to differentiate microstructures of food products,
in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.),
Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing
and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 289-293.
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M. van Ginkel, L.J. van Vliet, and P.W. Verbeek, Robust
Curvature Estimation by Finding Optimal Circular Segments in Orientation
Space, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W.
Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School
for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000,
53-58.
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L.R. van den Doel and L.J. van Vliet, A
Temporal Phase Unwrapping Algorithm Applied to Dynamic Interferograms Generated
in Evaporating Picoliter Liquid Samples, in: L.J. van Vliet, J.W.J.
Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th
Annual Conf. of the Advanced School for Computing and Imaging (Lommel,
Belgium, June 14-16), ASCI, Delft, 2000, 319-326.
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