|
all
selected
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
1997
1996
1995
1994
1993
1992
1990
1989
1988
| |
-
P.W. Verbeek and L.J. van Vliet, On
the location error of curved edges in low-pass filtered 2-D and 3-D images,
IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 16,
no. 7, 1994, 726-733.
-
L.J. van Vliet and P.W. Verbeek, Edge
localization by MoG filters: Multiple-of-Gaussians, Pattern Recognition
Letters, vol. 15, no. 5, 1994, 485-496.
-
B.J.H. Verwer, L.J. van Vliet, and P.W. Verbeek, Binary
and grey-value skeletons: Metrics and algorithms, in: C.Y. Suen, P.S.P. Wang (eds.), Thinning Methodologies for Pattern Recognition, Machine
Perception and Artificial Intelligence, vol. 8, World Scientific, Singapore,
1994, 323- 344.
-
J.C. Mullikin, L.J. van Vliet, H. Netten, F.R. Boddeke, G.W. van der Feltz,
and I.T. Young, Methods
for CCD camera characterization, in: H.C. Titus, A. Waks (eds.),
Image Acquisition and Scientific Imaging Systems, Proc. SPIE, vol. 2173,
1994, 73-84.
-
I.T. Young, A. Rutten, H. Netten, and L.J. van Vliet, Characterization
of a color CCD camera, Proc. ECA-AMCA Workshop on Microscope Instrumentation
(San Miniato I, April 21-24), 1994, 87-92.
-
L.J. van Vliet and P.W. Verbeek, Better
geometric measurements based on photometric information, Proc.
IEEE Instrumentation and Measurement Technology Conf. IMTC94 (Hamamatsu,
Japan, May 10-12), 1994, 1357-1360.
-
G. van der Feltz, D. Sudar, J. Piper, L.J. van Vliet, and I.T. Young,
Quality
assessment of CGH images, Proc. ECA-AMCA Workshop on CGH Imaging
(Edinburgh UK, June 3-4), 1994, 29-32.
-
H. Netten, I.T. Young, M. Prins, L.J. van Vliet, H.J. Tanke, H. Vrolijk,
and W. Sloos, Automation
of fluorescent dot counting in cell nuclei, Proc. 12th IAPR Int.
Conf. on Pattern Recognition, Volume I, Conf. A: Computer Vision and Image
Processing (ICPR12, Jerusalem, Israel, Oct. 9- 13), IEEE Computer Society
Press, Los Alamitos, CA, 1994, 84-87.
-
F.R. Boddeke, L.J. van Vliet, H. Netten, and I.T. Young, Autofocusing
in microscopy based on the OTF and sampling, BioImaging, vol. 2,
no. 4, 1994, 193-203.
-
H. Netten, L.J. van Vliet, F.R. Boddeke, P. de Jong, and I.T. Young,
A
fast scanner for fluorescence microscopy using a 2-D CCD and time delayed
integration, BioImaging, vol. 2, no. 4, 1994, 184-192.
|